作者: Ernest F. Guignon , George N. Gibson , William Page
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摘要: An instrument for measuring and analyzing surface plasmon resonance (SPR) and/or coupled emission on an electro-optic grating-coupled sensor is described herein. The chip achieves SPR through a approach, with variations in the local dielectric constant at regions of interest (ROI) detected as function intensity light reflecting from these ROI. Unlike other grating-based approaches, metal sufficiently thin that resonant conditions are sensitive to changes both above below (like Kretschmann configuration). Dielectric shifts occur mass accumulates can be returned reference intensities by applying voltage across underlying polymer. Approaches development surfaces described, software hardware features facilitating sample handling, data gathering, analysis this solid-state approach.