作者: C. A. J. van Eijk , J. W. G. Fleurkens , J. A. G. Jess
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摘要: A new and efficient method is presented to improve the validation capabilities of a discrete event simulator. Discrete monitors are introduced as means analyse traces during simulation run. This facilitates defection location erroneous behaviour in design specification. Furthermore, specification language for described it shown how this integration other methods. Experimental results demonstrate efficiency proposed techniques. >