Determination of shear stiffness based on thermal noise analysis in atomic force microscopy: Passive overtone microscopy
作者： Tanja Drobek , Robert W. Stark , Wolfgang M. Heckl
DOI: 10.1103/PHYSREVB.64.045401
关键词:
摘要: In torsional overtone microscopy, a dynamic atomic force microscopy technique, antisymmetric vibration modes of v-shaped cantilever are used to investigate the elastic properties tip-sample contact. order minimize amplitude, no external excitation is added in passive mode. this mode, thermomechanical noise surface coupled at room temperature analyzed. This allows shear stiffness contact be extracted from analysis power spectrum photodiode signal. The load dependence first on silicon, aluminum, and cadmium telluride surfaces compared with theoretical mechanical model.
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