Low-Noise Methods for Optical Measurements of Cantilever Deflections
作者： Tilman E. Schäffer
DOI: 10.1007/978-3-540-37316-2_3
关键词: Materials science 、 Shot noise 、 Optics 、 Low noise 、 Optical measurements 、 Cantilever 、 Atomic force microscopy
摘要:
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sci-hub.st 参考文章(91)
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