Exploiting cantilever curvature for noise reduction in atomic force microscopy
作者： Aleksander Labuda , Peter H. Grütter
DOI: 10.1063/1.3503220
关键词: Curvature 、 Order of magnitude 、 Shot noise 、 Optical coating 、 Noise spectral density 、 Cantilever 、 Materials science 、 Deflection (engineering) 、 Optics 、 Noise reduction
摘要: Optical beam deflection is a widely used method for detecting the of atomic force microscope (AFM) cantilevers. This paper presents first order derivation angular detection noise density which determines lower limit sensing. Surprisingly, cantilever radius curvature, commonly not considered, plays crucial role and can be exploited to decrease noise. We demonstrate reduction in shot more than an magnitude on home-built AFM with commercial 450 μm long by exploiting optical properties curvature caused reflective gold coating. Lastly, we how responsible up 45% variability measured sensitivity cantilevers commercially available AFMs.
harvard.edu
scitation.org
aip.org
researchgate.net 
sci-hub.se 参考文章(17)
Tilman E. Schäffer, Low-Noise Methods for Optical Measurements of Cantilever Deflections Springer Berlin Heidelberg. pp. 51- 74 ,(2007) , 10.1007/978-3-540-37316-2_3
Bharat Bhushan, H. Fuchs, Scanning probe microscopy techniques Springer. ,(2008)
Takeshi Fukuma, Masayuki Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada, Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy Review of Scientific Instruments. ,vol. 76, pp. 053704- ,(2005) , 10.1063/1.1896938
Gerhard Meyer, Nabil M. Amer, Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 53, 1045 (1988)] Applied Physics Letters. ,vol. 53, pp. 2400- 2402 ,(1988) , 10.1063/1.100425
Tilman E. Schäffer, Paul K. Hansma, Characterization and optimization of the detection sensitivity of an atomic force microscope for small cantilevers Journal of Applied Physics. ,vol. 84, pp. 4661- 4666 ,(1998) , 10.1063/1.368707
R Proksch, T E Schäffer, J P Cleveland, R C Callahan, M B Viani, Finite optical spot size and position corrections in thermal spring constant calibration Nanotechnology. ,vol. 15, pp. 1344- 1350 ,(2004) , 10.1088/0957-4484/15/9/039
Malvin Teich, Bahaa Saleh, Richard E. Slusher, Fundamentals of Photonics ,(1991)
Aleksander Labuda, William Paul, Brendan Pietrobon, R. Bruce Lennox, Peter H. Grütter, Roland Bennewitz, High-resolution friction force microscopy under electrochemical control. Review of Scientific Instruments. ,vol. 81, pp. 083701- ,(2010) , 10.1063/1.3470107
Takeshi Fukuma, Suzanne P. Jarvis, Development of liquid-environment frequency modulation atomic force microscope with low noise deflection sensor for cantilevers of various dimensions Review of Scientific Instruments. ,vol. 77, pp. 043701- ,(2006) , 10.1063/1.2188867
J. P. Cleveland, T. E. Schäffer, P. K. Hansma, Probing oscillatory hydration potentials using thermal-mechanical noise in an atomic-force microscope. Physical Review B. ,vol. 52, ,(1995) , 10.1103/PHYSREVB.52.R8692