Stochastic simulation of tip-sample interactions in atomic force microscopy

摘要: Atomic force microscopy (AFM) simulators, which are used to gain insight into tip-sample physics and data interpretation, so far have been optimized for modeling deterministic cantilever dynamics. In this article, we demonstrate a method semi-empirical simulation of the stochastic dynamics interactions. The detection, force, displacement noises separately generated directly from their numerically defined power spectral densities simulate spectroscopy experiment in water at mica interface. Mechanical noise AFM is shown dominate over thermal upon interaction with last two hydration layers.