Artifact-free dynamic atomic force microscopy reveals monotonic dissipation for a simple confined liquid
作者： G. B. Kaggwa , J. I. Kilpatrick , J. E. Sader , S. P. Jarvis
DOI: 10.1063/1.2950324
关键词: Dissipation 、 Frequency modulation 、 Non-contact atomic force microscopy 、 Mechanics 、 Analytical chemistry 、 Artifact (error) 、 Simple (abstract algebra) 、 Dissipative system 、 Resonance 、 Chemistry 、 Monotonic function
摘要: We present definitive interaction measurements of a simple confined liquid (octamethylcyclotetrasiloxane) using artifact-free frequency modulation atomic force microscopy. use existing theory to decouple the conservative and dissipative components interaction, for known phase offset from resonance (90° shift), that has been deliberately introduced into experiment. Further we show qualitative influence on error measurement, highlighting artifacts, such as oscillatory dissipation, can be readily observed when is not compensated in analysis.
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