Characterization of the surface morphology of diblock copolymers via low-voltage, high-resolution scanning electron microscopy and atomic force microscopy
作者： D. W. Schwark , D. L. Vezie , J. R. Reffner , E. L. Thomas , B. K. Annis
DOI: 10.1007/BF00729180
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sci-hub.se 参考文章(9)
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