Understanding tapping-mode atomic force microscopy data on the surface of soft block copolymers

作者: You Wang , Rui Song , Yingshun Li , Jingshu Shen

DOI: 10.1016/S0039-6028(03)00388-1

关键词:

摘要: … between TM-AFM and APD curve measurements to a very … (d) Cross-sectional profiles along the central black lines at … of both height and phase contrast for block copolymer TM-AFM …

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