Effectiveness of microarchitecture test program generation
作者： N. Utamaphethai , R.D.S. Blanton , J.P. Shen
DOI: 10.1109/54.895005
关键词:
摘要: Investigation of a list design errors typically encountered in industry is undertaken to determine if our microarchitecture test programs can detect them. Two metrics, functional and timing deviation are used error coverage.
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ieeecomputersociety.org参考文章(19)
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