Optical and dielectric results of Y0.225Sr0.775CoO3±δ thin films studied by spectroscopic ellipsometry technique
作者： A.I. Ali , J.Y. Son , A.H. Ammar , A. Abdel Moez , Y.S. Kim
DOI: 10.1016/J.RINP.2013.08.004
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摘要: Abstract Y0.225Sr0.775CoO3±δ thin films have been deposited on SrTiO3 (1 1 1), (1 0 0), LaAlO3 (1 0 0) and MgO (1 1 1) single crystals substrates at 500 °C by pulsed laser deposition (PLD) method. The optical measurements of these were studied ellipsometric method in the spectral range from 310 to 1240 nm. dependence constants, refractive index (n), extinction coefficient (k), dielectric loss ( e ‵ ) tangent different crystal was also studied. normal dispersion could be described using Wemple–DiDomenico oscillator parameters Eo Ed determined according above two direct indirect allowed transitions corresponding energy gap E g d ind . variation either or with revealed that, orientation affected value. Other such as surface function volume function. calculated optically. effective mass film has both electrical measurements.
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