作者: Ephrem A. Chemaly
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摘要: An automatic system for the inspection of surfaces an object employing computer vision. The examines uniformity surface and adds it to negative ideal mask, then thresholds result determine if is defective or not. A binary image showing only defects generated by system. ignores features, such as locating notches markings that are intentional, "fitting" them with their morphological negatives. Small electronic packages, integrated circuit plastic packages (e.g. dual-in-line DIPs), can be accurately inspected provides objective, fast economical method inspecting objects.