Morphological and crystalline characterization of pulsed laser deposited pentacene thin films for organic transistor applications

摘要: We show that high-quality pentacene (P5) thin films of high crystallinity and low surface roughness can be produced by pulsed laser deposition (PLD) without inducing chemical degradation the molecules. By using Raman spectroscopy X-ray diffraction measurements, we also demonstrate P5 on Au layers result in highly disordered films. While molecules arrange within well-documented 1.54-nm thin-film phase high-purity fused silica substrates, this ordering is indeed destroyed upon introducing an interlayer. This observation may one explanation for electrical performances measured P5-based organic film transistors (OTFTs) deposited laser-induced forward transfer (LIFT).