作者: Bei Zhang , S. Forouhar , S. Huang , W. Chang
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摘要: Properties of C 2 F 6 (freon 116) reactive ion-beam etching (RIBE) LiNbO 3 , Ti-indiffused and sputter-deposited Nb O 5 film on are reported. A maximum differential ratio approximately 5:1 has been measured for the AZ 1350B Shipley photoresist. We have used this technique to fabricate diffraction gratings both - waveguides with throughput efficiencies in excess 85 percent.