Electrostatic potential variation across the surface of a diamond/β-SiC nanocomposite thin film
作者： Mohan Kumar Kuntumalla , Vadali Venkata Satya Siva Srikanth , None
DOI: 10.1016/J.VACUUM.2013.10.006
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摘要: Abstract Electrostatic potential variation across surface of a diamond/β-SiC nanocomposite thin film is obtained using scanning Kelvin probe microscopy. An average electrostatic ∼ −120 mV measured on the (5 × 5 μm 2 ) film. Using this value and nominal work function probe, values constituents could be estimated. In conjunction with secondary electron micrograph, map features are relevantly assigned to respective in
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