Single layer homogeneous model for surface roughness by polarized light scattering

作者: Udaibir Singh , Avinashi Kapoor

DOI: 10.1016/J.OPTLASTEC.2007.06.001

关键词:

摘要: In this paper a homogeneous single layer model for surface roughness by polarized light has been developed. It shown that the reflectance change in non-absorbing is directly proportional to refractive index of ambient and substrate media s polarization but inversely p it square thickness both polarization. an absorbing layer, equal twice identical system ratio thin film The extinction coefficient consequence scattered on specular transmittance oblique incidence shows there reduction (in cases) case only), due under Drude effective-medium approximation. Thus such provides valid effect scatter only.

参考文章(28)
Z. Knittl, Peter H. Berning, Optics of Thin Films Physics Today. ,vol. 30, pp. 59- 60 ,(1977) , 10.1063/1.3037418
C. K. Carniglia, D. G. Jensen, Single-layer model for surface roughness Applied Optics. ,vol. 41, pp. 3167- 3171 ,(2002) , 10.1364/AO.41.003167
M. Zeman, R. A. C. M. M. van Swaaij, J. W. Metselaar, R. E. I. Schropp, Optical modeling of a-Si:H solar cells with rough interfaces: Effect of back contact and interface roughness Journal of Applied Physics. ,vol. 88, pp. 6436- 6443 ,(2000) , 10.1063/1.1324690
Thomas A. Germer, Clara C. Asmail, Bradley W. Scheer, Polarization of out-of-plane scattering from microrough silicon Optics Letters. ,vol. 22, pp. 1284- 1286 ,(1997) , 10.1364/OL.22.001284
Y‐P Zhao, Y‐J Wu, H‐N Yang, G‐C Wang, T‐M Lu, None, In situ real‐time study of chemical etching process of Si(100) using light scattering Applied Physics Letters. ,vol. 69, pp. 221- 223 ,(1996) , 10.1063/1.117378
Jung Hyeun Kim, Sheryl H. Ehrman, George W. Mulholland, Thomas A. Germer, Polarized light scattering by dielectric and metallic spheres on silicon wafers Applied Optics. ,vol. 41, pp. 5405- 5412 ,(2002) , 10.1364/AO.41.005405
T. Pinnington, C. Lavoie, T. Tiedje, B. Haveman, E. Nodwell, SURFACE MORPHOLOGY DYNAMICS IN STRAINED EPITAXIAL INGAAS Physical Review Letters. ,vol. 79, pp. 1698- 1701 ,(1997) , 10.1103/PHYSREVLETT.79.1698
H. Giovannini, C. Amra, Scattering-reduction effect with overcoated rough surfaces: theory and experiment. Applied Optics. ,vol. 36, pp. 5574- 5579 ,(1997) , 10.1364/AO.36.005574
Tansel Karabacak, Yiping Zhao, Matthew Stowe, Bill Quayle, Gwo-Ching Wang, Ton-Ming Lu, Large-angle in-plane light scattering from rough surfaces. Applied Optics. ,vol. 39, pp. 4658- 4668 ,(2000) , 10.1364/AO.39.004658