Process for fabricating a substrate of the silicon-on-insulator type

作者: Eric Neyret , François Boedt

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摘要: The invention relates to a process for fabricating substrate (6) of the SOI (silicon on insulator) type, comprising thin silicon layer (11), surface roughness which is uniform, and buried SiO2 layer, thickness uniform. This noteworthy in that it comprises following steps, consisting in: a) atomic or ionic species are co-implanted donor (1), so as form therein weakened zone (10) forms boundary between said (11) remainder (12); b) this (1) bonded (3) by molecular adhesion, (2) oxide being interposed two; c) and/or (12) detached along (10), mainly mechanically; d) carrying out at least one finishing step long thermal annealing, gaseous atmosphere hydrogen argon, temperature 950°C but not exceeding 1100°C.