Capacitive thickness gauging for ungrounded elements

摘要: A system for capacitively gauging distance to an element which is not in a low impedance path ground. The operates provide indication of with the potential on at defined level, typically Several embodiments are presented making this measurement. first measure periodic instances when exists. second embodiment uses phase opposite excitation produce either by specific placement or through feedback control over potential. present invention may be adapted use capacitive thickness measurement ungrounded highly resistive element.