Strain mapping near a triple junction in strained Ni-based alloy using EBSD and biaxial nanogauges

作者: A. Clair , M. Foucault , O. Calonne , Y. Lacroute , L. Markey

DOI: 10.1016/J.ACTAMAT.2011.01.051

关键词:

摘要: … were compared to the texture obtained by EBSD. ► Statistics of the principal strain discern … In addition, the kernel average misorientation (KAM) is another parameter indicative of the …

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