作者: Jung-Ho Shin , Doo-In Kim , Kyung-mox Cho , Hisayuki Suematsu , Kwang Ho Kim
DOI: 10.1016/J.JNONCRYSOL.2012.11.023
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摘要: Abstract The plasticity-induced nanocystalline phase transformation in the Zr65Cu35 thin film metallic glass (TFMG) was examined. A synthesized by direct current magnetron sputtering. of confirmed X-ray diffraction and high resolution transmission electron microscopy (HR-TEM). TFMG deformed micro Knoop indentation, approximately 60% thickness plastically. formation shear bands observed at edge indentation impressions. HR-TEM showed that nanocrystallization occurred only vicinity step-like formed impression. No other places, such as under heavily center area distinctive explained terms enhanced atomic mobility severe localized plastic deformation bands.