Surface Orientation Effect of the Shadow of the Stacking Fault
作者： Hideo Sunami , Takeshi Terasaki , Nobuo Miyamoto , Jun‐ichi Nishizawa
DOI: 10.1063/1.1657258
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摘要:
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sci-hub.se 参考文章(1)
C. M. Drum, C. A. Clark, Geometrical Stability of Shallow Surface Depressions During Growth of (111) and (100) Epitaxial Silicon Journal of The Electrochemical Society. ,vol. 115, pp. 664- 669 ,(1968) , 10.1149/1.2411385