Two-dimensional mapping of chemical information at atomic resolution.
作者： M. Bosman , V. J. Keast , J. L. García-Muñoz , A. J. D’Alfonso , S. D. Findlay
DOI: 10.1103/PHYSREVLETT.99.086102
关键词:
摘要: The simultaneous measurement of structural and chemical information at the atomic scale provides fundamental insights into connection between form function in materials science nanotechnology. We demonstrate mapping Bi{sub 0.5}Sr{sub 0.5}MnO{sub 3} using an aberration-corrected scanning transmission electron microscope. Two-dimensional is made possible by adapted method for fast acquisition energy-loss spectra. experimental data are supported simulations, which help to explain less intuitive features.
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