Absorption spectroscopy with sub-angstrom beams: ELS in STEM
作者：
DOI: 10.1088/0034-4885/69/3/R04
关键词: Resolution (electron density) 、 Synchrotron 、 Physics 、 Scattering 、 Spectroscopy 、 Density of states 、 Atomic physics 、 Scanning electron microscope 、 Monochromator 、 Absorption spectroscopy
摘要: Electron-energy loss spectroscopy (EELS) performed using a modern transmission scanning electron microscope (STEM) now offers sub-nanometre spatial resolution and an energy down to 200 meV or less, in favourable cases. The absorption spectra, which probe empty states, cover the soft x-ray region may be obtained under conditions of well-defined momentum transfer (angle-resolved), providing double projection onto crystallographic site symmetry within density states. By combining very high brightness field-emission sources (brighter than synchrotron) with cross-section scattering, together parallel detection (not possible spectroscopy), form ideally suited study nanostructures, interfacial states defects materials is uniquely resolution. We review basic theory, relationship EELS optical properties dielectric response function, removal multiple scattering artefacts channelling effects. consider applications light recent developments aberration corrector monochromator design. Examples are cited inner-shell spectra from individual atoms thin crystals, electronic semiconductors, near edge structure mapped glasses carbon nanotubes, amongst many others.
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sci-hub.se 参考文章(83)
P. E. Batson, J. Silcox, Experimental energy-loss function,Im[−1ε(q,ω)], for aluminum Physical Review B. ,vol. 27, pp. 5224- 5239 ,(1983) , 10.1103/PHYSREVB.27.5224
J. Daniels, C. v. Festenberg, H. Raether, K. Zeppenfeld, Optical constants of solids by electron spectroscopy Springer Tracts in Modern Physics. ,vol. 54, pp. 77- 135 ,(1970) , 10.1007/BFB0045980
H. Kohl, H. Rose, Theory of Image Formation by Inelastically Scattered Electrons in the Electron Microscope Advances in Electronics and Electron Physics. ,vol. 65, pp. 173- 227 ,(1985) , 10.1016/S0065-2539(08)60878-1
D. A. Muller, T. Sorsch, S. Moccio, F. H. Baumann, K. Evans-Lutterodt, G. Timp, The electronic structure at the atomic scale of ultrathin gate oxides Nature. ,vol. 399, pp. 758- 761 ,(1999) , 10.1038/21602
H. Kohl, Ludwig Reimer, Transmission Electron Microscopy ,(2009)
Richard M. Martin, Electronic Structure: Basic Theory and Practical Methods ,(2004)
I.P. Jones, Determining the locations of chemical species in ordered compounds: ALCHEMI Advances in Imaging and Electron Physics. ,vol. 125, pp. 63- I ,(2003) , 10.1016/S1076-5670(02)80015-5
John C. H. Spence, High-Resolution Electron Microscopy ,(2013)
S.J. Pennycook, Structure determination through Z-contrast microscopy Advances in Imaging and Electron Physics. ,vol. 123, pp. 173- 206 ,(2002) , 10.1016/S1076-5670(02)80063-5
Harald Müllejans, Roger H. French, Insights into the Electronic Structure of Ceramics through Quantitative Analysis of Valence Electron Energy-loss Spectroscopy. Microscopy and Microanalysis. ,vol. 6, pp. 297- 306 ,(2000) , 10.1017/S1431927602000533