Some remarks on fitting standard- and high resolution C 1s and O 1s x-ray photoelectron spectra of PMMA
作者： Th Gross , A Lippitz , WES Unger , Ch Wöll , G Hähner
DOI: 10.1016/0169-4332(93)90248-A
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摘要: Abstract Thin PMMA films were investigated by high- and standard-resolution XPS variable-angle NEXAFS. The results of fitting the respective C 1s O XP spectra are compared with latest literature data. It is found that using a non-constrained “1:1:1:2” strategy good agreement between high-resolution can be achieved regard to BE shifts trends in intensity FWHM spectral components. A fit reveals same characteristic differences as well non-stoichiometric relative component intensities observed experiments. Comparison obtained low-energy (380 eV) photons those MgKα X-ray supported inspection K-edge NEXAFS spectrum there should an outermost film layer dominated methyl groups. also suggest non-isotropic orientation molecules surface region.
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David G. Castner, Buddy D. Ratner, Surface characterization of butyl methacrylate polymers by XPS and static SIMS Surface and Interface Analysis. ,vol. 15, pp. 479- 486 ,(1990) , 10.1002/SIA.740150807
Andrew. Proctor, Peter M. A. Sherwood, Data analysis techniques in x-ray photoelectron spectroscopy Analytical Chemistry. ,vol. 54, pp. 13- 19 ,(1982) , 10.1021/AC00238A008
G. Beamson, A. Bunn, D. Briggs, HIGH-RESOLUTION MONOCHROMATED XPS OF POLY(METHYL METHACRYLATE)THIN FILMS ON A CONDUCTING SUBSTRATE Surface and Interface Analysis. ,vol. 17, pp. 105- 115 ,(1991) , 10.1002/SIA.740170206
Joseph A. Gardella, Recent advances in ion and electron spectroscopy of polymer surfaces Applied Surface Science. ,vol. 31, pp. 72- 102 ,(1988) , 10.1016/0169-4332(88)90025-6
Ralf Vanselow, R. Howe, Chemistry and physics of solid surfaces Springer-Verlag. ,(1982)
Thomas J. Hook, Robert L. Schmitt, Joseph A. Gardella, Lawrence. Salvati, Roland L. Chin, Analysis of polymer surface structure by low-energy ion scattering spectroscopy Analytical Chemistry. ,vol. 58, pp. 1285- 1290 ,(1986) , 10.1021/AC00298A004
DA Outka, J Stöhr, JP Rabe, JD Swalen, None, The orientation of Langmuir–Blodgett monolayers using NEXAFS Journal of Chemical Physics. ,vol. 88, pp. 4076- 4087 ,(1988) , 10.1063/1.453862
A. P. Pijpers, W. A. B. Donners, Quantitative determination of the surface composition of acrylate copolymer latex films by XPS (ESCA) Journal of Polymer Science Part A. ,vol. 23, pp. 453- 462 ,(1985) , 10.1002/POL.1985.170230219
A. Naves de Brito, M. P. Keane, N. Correia, S. Svensson, U. Gelius, B. J. Lindberg, Experimental and theoretical XPS study of model molecules for poly(methyl methacrylate) Surface and Interface Analysis. ,vol. 17, pp. 94- 104 ,(1991) , 10.1002/SIA.740170205
P. J. Cumpson, M. P. Seah, Random uncertainties in AES and XPS: I: Uncertainties in peak energies, intensities and areas derived from peak synthesis Surface and Interface Analysis. ,vol. 18, pp. 345- 360 ,(1992) , 10.1002/SIA.740180508