Analysis of polymer surface structure by low-energy ion scattering spectroscopy
作者： Thomas J. Hook , Robert L. Schmitt , Joseph A. Gardella , Lawrence. Salvati , Roland L. Chin
DOI: 10.1021/AC00298A004
关键词:
摘要:
acs.org
sci-hub.se 参考文章(15)
David P. Smith, Analysis of surface composition with low-energy backscattered ions Surface Science. ,vol. 25, pp. 171- 191 ,(1971) , 10.1016/0039-6028(71)90214-7
H E Bishop, D M Poole, A simple method of thin film analysis in the electron probe microanalyser Journal of Physics D. ,vol. 6, pp. 1142- 1158 ,(1973) , 10.1088/0022-3727/6/9/318
David P. Smith, Scattering of Low‐Energy Noble Gas Ions from Metal Surfaces Journal of Applied Physics. ,vol. 38, pp. 340- 347 ,(1967) , 10.1063/1.1708979
J. D. Brown, R. H. Packwood, Quantitative electron probe microanalysis using Gaussian φ(ρz) Curves X-Ray Spectrometry. ,vol. 11, pp. 187- 193 ,(1982) , 10.1002/XRS.1300110411
J. R. Diehl, J. M. Stencel, C. A. Spitler, L. E. Makovsky, Effects of hydrogen on ISS analysis of dispersed metal catalysts Surface and Interface Analysis. ,vol. 6, pp. 56- 61 ,(1984) , 10.1002/SIA.740060204
M. Umana, P. Denisevich, D. R. Rolison, S. Nakahama, Royce W. Murray, Comparison of X-ray Photoelectron Spectroscopy and Cyclic Voltammetry for the Determination of Polymeric Film Thickness of Ruthenium Vinylbipyridine and Vinylferrocene Deposited on Electrodes Analytical Chemistry. ,vol. 53, pp. 1170- 1175 ,(1981) , 10.1021/AC00231A007
R. F. Roberts, D. L. Allara, C. A. Pryde, D. N. E. Buchanan, N. D. Hobbins, Mean free path for inelastic scattering of 1.2 kev electrons in thin poly(methylmethacrylate) films Surface and Interface Analysis. ,vol. 2, pp. 5- 10 ,(1980) , 10.1002/SIA.740020103
Bruce R. Kowalski, David J. Veltkamp, Chemical Information from Ion Scattering Spectrometry. Analytical Chemistry. ,vol. 57, pp. 88- 91 ,(1985) , 10.1021/AC00279A025
Peter J. Statham, The generation, absorption and anisotropy of thick‐target bremsstrahlung and implications for quantitative energy dispersive analysis X-Ray Spectrometry. ,vol. 5, pp. 154- 168 ,(1976) , 10.1002/XRS.1300050310
Joseph A. Gardella, David M. Hercules, Comparison of static secondary ion mass spectrometry, ion scattering spectroscopy, and X-ray photoelectron spectroscopy for surface analysis of acrylic polymers Analytical Chemistry. ,vol. 53, pp. 1879- 1884 ,(1981) , 10.1021/AC00235A037