Apparatus and method for measuring of absolute values of penetration depth and surface resistance of metals and superconductors
作者： Steven Mark Anlage , Vladimir V. Talanov
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摘要: An apparatus and method for accurately estimating the absolute value of surface resistances penetration depths metallic films bulk samples. The carries out measurements using two nominally identical samples with flat sample surfaces which are brought together a thin dielectric separation variable thickness sandwiched between in order to form two-conductor parallel plate transmission line resonator an electromagnetic wave. A liquid or gas unknown properties fills spacer. resonant condition microwave signal is established frequency quality factor Q measured while spacing plates varied. variation spacer then analyzed yield values resistance depth further used determination complex conductivity impedance
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