The reliability of pocket probing around screw-type implants

作者: M. Quirynen , D. Van Steenberghe , R. Jacobs , A. Schotte , P. Darius

DOI: 10.1034/J.1600-0501.1991.020405.X

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摘要: This study involved 108 patients (age 38–82 years) rehabilitated with overdentures in the lower jaw supported by 2 endosseous screw-shaped implants. At each follow-up visit, clinical attachment level (PAL) around implants was assessed a Merrit-B probe or constant force electronic probe, Peri-probe, and biannually parallel long-cone radiographs were taken to locate marginal bone level. These data used examine relationship between estimations As mean, scored 1.4 mm apically of PAL this difference remained time. The Pearson correlation coefficient PAL, for mesial distal sites, 0.67 0.61 0.76 0.65, respectively Peri-probe. highest correlations obtained sites healthy gingiva absence intra-bony craters. Duplicate registrations showed standard deviation intra-examiner variability 0.37 (Peri-probe) 0.40 (Merrit-B probe) more than 90% variation within 0.5 mm. mean Peri-probe 0.05 It concluded that determination is reliable indicator moderate gingiva.

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