作者: Dirk C. Meyer , Kurt Richter , Peter Paufler , Peter Gawlitza , Thomas Holz
DOI: 10.1063/1.372972
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摘要: Results of quantitative analysis fluorescence x-ray absorption fine structure (XAFS) experiments at the Fe–K edge are presented for a 6*(4.3 nm Fe/10.4 Al) multilayer prepared by pulsed laser deposition. Fluorescence XAFS have been combined with excitation standing waves. This combination in one experiment allowed depth-controlled Fe and hence depth-resolved short-range order. Depth-resolved showed that instead sharp Fe/Al or Al/Fe interfaces extended interlayer regions exist. The retained bulk α-Fe. In upper half layer 37 at. % Al as nearest next neighbors were found, whereas lower 80 atoms occur. Thus interface (deposition on should be characterized an intermixing zone significantly larger comparison to Fe). By conventional measurement carried out fix...