Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples.
作者： Yu-Ying Huang , Zhan-Shan Wang , Wen-Bin Li , Xiao-Yue Yang , Jing-Tao Zhu
DOI: 10.1107/S1600577514001970
关键词:
摘要: A novel correction method for self-absorption effects is proposed extended X-ray absorption fine structure (EXAFS) detected in the fluorescence mode on multilayer samples. The of refraction and multiple reflection at interfaces are fully considered this method. performed k-space before any further data analysis, it can be applied to single-layer or samples with flat surfaces without thickness limit when model parameters known. validity verified by EXAFS collected a Cr/C sample measured different experimental geometries.
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