High frequency dielectric properties of PLZT thin films
作者： William Williamson Iii , Chen H. Daniel , Eric L. Cross , Barry K. Gilbert
DOI: 10.1080/10584589708012994
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摘要: Abstract The dielectric constant and loss tangent of a variety compounds sol-gel PLZT have been studied at frequencies up to 50 GHz the method investigation involves measuring microwave striplines with small parallel plate capacitors shunted ground. Measured S-parameters are used calculate properties. data shows no significant dispersion mechanism in 1 – range. It does appear that moderate is due domain wall effects.
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