Composite bitmap visualization techniques for advanced ferroelectric memories
作者： J. Eliason , P. Staubs , J. Groat , J. Rodriguez
DOI: 10.1109/ISAF.2008.4693961
关键词:
摘要: The year 2007 was a breakout for advanced F-RAM. Two products manufactured on Texas Instruments? 130nm ferroelectric memory process are now commercially available from Ramtron, and TI announced its intention to leverage the benefits of F-RAM in next generation RFID products. New composite bitmap visualization software created by Ramtron aided development reliable manufacturable This paper will describe demonstrate some powerful data analysis techniques enabled this software.
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