PROBING SURFACE MICROTHERMAL PROPERTIES BY SCANNING THERMAL MICROSCOPY
作者： V. V. Gorbunov , N. Fuchigami , J. L. Hazel , V. V. Tsukruk
DOI: 10.1021/LA990913A
关键词:
摘要: Scanning thermal microscopy (SThM) was used for probing surface microthermal properties of a wide range materials from polymers to metals. We demonstrated that SThM measurements in contact mode can provide unique capabilities unambiguous localized conductivity variety surfaces with sensitivity better than 0.05 W m-1 K-1 and lateral resolution the 0.03 μm hard 1 compliant materials. Variation correlates fairly well known bulk values For materials, significant contribution local deformation measured response is noted.
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