Reliability of Crystalline Indium–Gallium–Zinc-Oxide Thin-Film Transistors Under Bias Stress With Light Illumination
作者： Kyung Park , Hyun-Woo Park , Hyun Soo Shin , Jonguk Bae , Kwon-Shik Park
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摘要: … After measuring the initial electrical properties of the IGZO TFTs, we evaluated the device reliability under bias and light illumination stress as a function of the stress time. The change in …
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