Influence of the growth mechanism on the grain boundary structure in YBa2Cu3O7 thin film bicrystals
作者： J. Ayache , A. Thorel , J. Le Duigou , J. Bonevich , U. Dahmen
DOI: 10.1016/S0925-8388(96)02774-0
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摘要: Abstract The growth control of thin YBa 2 Cu 3 O 7 (YBCO) film bicrystals determines the quality Josephson junctions and weak links. Previous TEM experiments on various showed grain boundary oscillations that were not clearly explained. We combined AFM, SEM, conventional HRTEM in order to perform a complete characterization both substrate bicrystals. Our results show are due YBCO mechanisms leading conflictual crystallographic situation at boundary. resulting structure may affect interpretation several recent purporting determine nature HTC superconductivity.
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