You can catch more bugs with transaction level honey

作者: Miron Abramovici , Kees Goossens , Bart Vermeulen , Jack Greenbaum , Neal Stollon

DOI: 10.1145/1450135.1450163

关键词:

摘要: In this special session we explore holistic approaches to hardware/software debug that use or integrate transaction level models (TLMs). We present several TLM-based system-level diagnostics, ranging from of most popular modeling languages through hybrid technologies combine TLMs with other well known diagnostic tools like in-silicon trace logic.

参考文章(0)