Effect of Al-Induced Crystallization on Structure of CdZnTe Thin Films Deposited by Radio Frequency Magnetron Sputtering
作者： Dong Mei Zeng , Yin Yin Mu , Wan Liu , Hai Zhou , Fei Chen
DOI: 10.4028/WWW.SCIENTIFIC.NET/AMR.941-944.1288
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摘要: Different substrate temperature of CdZnTe films and one with Al-induced crystallization have been investigated by XRD, AFM UV-spectrophotometry. It was shown that, as the varied from room to 400 °C, improving helps enhance grain size film, favours preferential orientation (111). Moreover, method can effectively reduce film so that be for high-quality oriented in a lower temperature. In addition, make surface roughness at small value facilitates later application film.
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