The interpretation of X-ray diffraction data from thin epitaxial lead tin telluride crystals—II

摘要: Abstract The difusion of tin across heterojunctions formed between thin epitaxial layers lead telluride, or telluride grown on each other, has been examined by comparing the experimental X-ray diffraction data with theoretical envelopes, calculated convoluting idealized diffusion profiles. results show that, for is best described an error function, and telluride. exponential function provides fit data.