作者: X.J. Zheng , J.Y. Liu , J.F. Peng , X. Liu , Y.Q. Gong
DOI: 10.1016/J.TSF.2013.09.017
关键词:
摘要: Abstract (1 − x)Na0.5Bi0.5TiO3–xK0.5Bi0.5TiO3 (NBT–KBT100x) (x = 0.13, 0.15, 0.18, 0.20, 0.25) thin films were prepared by metal–organic decomposition, and the crystalline structures, surface morphologies, leakage current densities dielectric, piezoelectric, ferroelectric properties investigated X-ray diffractometer, scanning electron microscopy, semiconductor characterization system, probe tester, respectively. The electrostrictive equation in phenomenological theory is used to model piezoelectric electrostriction behaviors of relaxor films, coefficient couples effective with polarization relative permittivity. strains are larger than for NBT–KBT100x coefficients at ranges 0.019–0.025 m4/C2 0.12%–0.26%, NBT–KBT15 film largest strain, it attributed appropriate potassium content near morphotropic phase boundary equivalent energy coexistence. results indicate that NBT-based high a promising candidate application electromechanical devices.