Instrumentation and Experimental Techniques

摘要: Electron microscope instrumentation is changing very rapidly, so this chapter outlines only the general features which are desirable in an electron intended for microdiffraction work. Many of instrumental requirements (particularly pole-piece region) will be found to similar those energy-dispersive X-ray microanalysis. With field-emission instruments used smallest probes, need a large tilting range may conflict with electron-optical subnanometer probe formation, requires small gap. Several manufacturers now prepared offer customer series compromise designs, from tilt and minimum size combination can selected. Certainly, most applications described book use “incoherent” mode, double holder offering at least ±40° one direction ±60° other desirable.