Application and demonstration of a digital test core: optoelectronic test bed and wafer-level prober
作者： J.S. Davis , D.C. Keezer , O. Liboiron-Ladouceur , K. Bergman
DOI: 10.1109/TEST.2003.1270837
关键词:
摘要: Abstract A multi-purpose digital test core utilizing programmable logic has been introduced [1,2] to implement many of the functions traditional automated equipment (ATE). While previous papers have described theory, this paper quantifies results and presents additional applications with improved methods operating up 4.4Gpbs. The provides a substantial number I/O for testing circuits systems. It may be used either enhance capabilities ATE or provide autonomous within large systems arrays components. This technique expanded upon produce greater functionality at higher frequencies. Based limitations current BIST, need is described. concept reviewed an opto-electronic pattern generator sampler eventual goal terabit-per-second aggregate data rate. performance device discussed, second application as nano-scale wafer-level embedded tester.
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