Contactor assembly for common grid array devices

摘要: A contactor apparatus used in automatic testing of integrated circuits is provided. The invented apparatus, or assembly, enables the rapid automated test transition from a plurality devices first body shape to having second shape, where both types have electrical contacts arranged within device contact plane and according common grid pattern. pattern may be along an X orthogonal Y axis, points are spaced at identical intervals each e.g. point 0.8 millimeter by location, differing dimension, located lengths axis 1.2 axis. apertures useful simultaneously devices.