作者: Stephen J Spells , Mary J Hill
DOI: 10.1016/0032-3861(91)90098-4
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摘要: Abstract The annealing of polyethylene single crystals has been studied using time-dependent X-ray diffraction. behaviour the small-angle diffraction peak is found to depend on both temperature ( T a ) and rate heating that temperature. For 10°C min −1 ⩽ 123°C, results are consistent with localized solid state reorganization. Using 500°C for any or > 123°C resulted in dramatic loss intensities at intermediate times, larger scale melting. Transmission electron micrographs annealed samples show an improvement lamellar orientation 120°C. Small angle data give no indication this improvement. To reconcile these results, we propose domain structure present supporting evidence from microscopy boundaries.