作者: BS Hsiao , KH Gardner , None
DOI: 10.1007/978-94-011-1950-4_37
关键词: Lamellar structure 、 Crystallization 、 Temperature jump 、 Ether 、 X-ray 、 Peek 、 Crystallography 、 Materials science 、 Small-angle X-ray scattering 、 Crystallinity 、 Organic chemistry
摘要: Time-resolved small-angle X-ray scattering (SAXS) experiments were conducted to study the crystallization and melting behavior of poly(aryl ether ketone), PEEK, using synchrotron radiation a dual-chamber temperature jump apparatus. The long period L, invariant Q lamellar thickness lc determined from correlation function data. During crystallization, it was found that L decreased, increased, lC remained about constant with time. decrease in explained by insertion within stacks, whereas increase attributed total degree crystallinity. melting, increased two-stage fashion: small below lower double-melting large above that. Both also but showed maximum before higher temperature. These results support model two populations lamellae different PEEK (proposed Bassett et al. [1]): primary are developed first bundle-like stacks narrower secondary inserted later lamellae.