Electron-microscopic investigation of the morphology of a melt-crystallized polyaryletherketone

摘要: We have studied the structure and morphology of useful high‐temperature/high‐strength polymer polyaryletherketone (PEEK) by transmission electron microscopy three‐dimensional diffraction after finding suitable solvents (α‐chloronaphthalene benzophenone) that allowed casting required ultrathin films. When crystallized from melt, PEEK grows in form spherulites consisting narrow lamellae having b axis unit cell radial. Additionally, at high temperatures these films, attain an extraordinary cylindrical symmetry as a result growth their on edge, with c crystallographic direction parallel to film plane corresponding cylinder axis. Reasons for this mode are attributed highly anisometric molecular cross section normal chain direction, which favors crystal nucleation substrate bc plane. At lower during crystallization more random lamellar disposition is seen thin‐film spherulites, although edge still predominate. Crystallization heating quenched glassy phase yields aggregates small spherulites. The shows no consistent morphological features down level resolution 1.0 nm. Scanning microscopic examination free surfaces bulk samples under controlled conditions both melt glass, show our findings films (with exception quasicylindrical spherulitic substructure) also apply thicker specimens.