作者: S. Nakagomi , K. Yokoyama , Y. Kokubun
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摘要: Abstract. Field-effect hydrogen gas sensor devices were fabricated with the structure of a series connection between Schottky junctions and β-Ga2O3/6H-SiC heterojunctions. β-Ga2O3 thin films deposited on n-type p-type 6H-SiC substrates by gallium evaporation in oxygen plasma. These have rectifying properties characterized as sensors Pt electrode. The hydrogen-sensing both measured range 300–500 °C. Pt/Ga2O3/n-SiC device revealed conventional diode-type devices. forward current Pt/Ga2O3/p-SiC was significantly increased under exposure to hydrogen. behaviors sensing explained using band diagrams Pt/Ga2O3/SiC biased reverse directions.