Aspects of silicate surface and bulk structure analysis using X-ray photoelectron spectroscopy (XPS)
作者： Michael F Hochella , Gordon E Brown
DOI: 10.1016/0016-7037(88)90232-3
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摘要: … in the near-surface region of … mineral standards used in this study, the FWHM for each 0 1s line and a schematic representation of the oxygen coordination complexes from each structure…
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