Fabrication and characterization of textured Bi2Te3 thermoelectric thin films prepared on glass substrates at room temperature using pulsed laser deposition

摘要: Thin films of n-type Bi2Te3 were fabricated on glass substrates at room temperature using pulsed laser deposition. Samples characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), Raman spectroscopy, and a physical properties measurement system. The XRD results show that crystalline can be easily achieved temperature, all have preferred crystal growth texture along the (0 1 5) direction. SEM indicates are high-quality smooth. Seebeck coefficient, electrical resistivity, magnetoresistance measured over wide ranges magnetic field. It was found coefficient significantly enhanced after annealing process.