作者: R Zeipl , M Jelínek , M Vlček , T Kocourek , J Remsa
DOI: 10.1088/1054-660X/25/1/015903
关键词:
摘要: A method for relative thermal conductivity characterization of thin thermoelectric layers and multi-layered structures in nanometre range using a scanning microscope working an active constant current mode is suggested. The requires very smooth high quality surface the studied system. To fulfil these requirements study influence principal deposition conditions including substrate temperature laser beam density on Bi2Te3 prepared by pulsed was performed its results are presented.