作者: R. Zeipl , S. Karamazov , M. Jelinek , P. Lostak , M. Pavelka
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摘要: Transport properties are presented for 60nm thick layers which were prepared by the laser ablation from a Bi/sub 2/Te/sub 3/ target. The deposited on quartz glass substrates. energy density of beam I target is 2Jcm/sup -2/ and temperature substrate during deposition varies between (200-480/spl deg/C) different samples. influence topography measured Scanning Tunnelling Microscope (STM) presented. BiTe 2/Te phases detected X-ray Diffraction (XRD) method.