作者: Nikolas Zographos , Christoph Zechner , Ignacio Martin-Bragado , Kyuho Lee , Yong-Seog Oh
DOI: 10.1016/J.MSSP.2016.10.037
关键词:
摘要: … including different process steps and effects such as ion implantation, dopant and defect … will focus on process simulation for doping processes in advanced semiconductor devices. …